Title :
Simulations with the 3D TLM SCN using FD-TD absorbing boundary conditions
Author :
Mueller, U. ; Beyer, A. ; Rittweger, M.
Author_Institution :
Dept. of Electr. Eng. & Sonderforschungsbereich, Duisburg Univ., Germany
Abstract :
The FD-TD (finite-difference time-domain) absorbing boundary conditions for one-dimensional wave propagation are adapted to the 3-D SCN (symmetrical condensed node) TLM (transmission line matrix) mesh. The properties of these boundary conditions are characterized for a simple TEM (transverse electromagnetic) waveguide structure, and their applicability to complex structures is demonstrated by calculating scattering parameters for a microstrip step.<>
Keywords :
finite element analysis; microstrip components; microstrip lines; waveguide theory; 3D TLM SCN; FD-TD absorbing boundary conditions; TEM; TEM waveguides; complex structures; finite-difference time-domain; microstrip step; one-dimensional wave propagation; scattering parameters; symmetrical condensed node; transmission line matrix; waveguide structure; Boundary conditions; Electromagnetic propagation; Electromagnetic propagation in absorbing media; Electromagnetic scattering; Electromagnetic waveguides; Finite difference methods; Scattering parameters; Symmetric matrices; Time domain analysis; Transmission line matrix methods;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.187991
