Fast and accurate computation of dielectric losses in multi-layer, multi-conductor microstrip structures

An approach is proposed which can be used in lieu of lossy, full-wave solutions to provide accurate and efficient data for the CAD (computer-aided design) of multilayer, multiconductor MIC and MMIC (monolithic microwave integrated circuits) structures. This application gives results that are as accurate as lossy full-wave techniques over a wide range of frequency, including the dispersive region. In addition to giving accurate results, this method is up to three times faster, depending on the number and type of substrates or superstrates. Results are shown for various symmetric and asymmetric, multiconductor, multilayer structures which have good agreement with the lossy, fully-wave approach and use significantly less computer time.<>