An integrated, low noise patch-clamp amplifier for biological nanopore applications

Author

Wang, Gang ; Dunbar, William B.

Author_Institution

Comput. Eng., Univ. of California, Santa Cruz, Santa Cruz, CA, USA

fYear

2010

fDate

Aug. 31 2010-Sept. 4 2010

Firstpage

2718

Lastpage

2721

Abstract

We present an integrated, low noise patch-clamp amplifier for biological nanopore applications. Our amplifier consists of an integrator-differentiator architecture coupled with a novel opamp design in the CMOS 0.35 μm process. The post-layout full-chip simulation shows the input referred noise of the amplifier is 0.49 pA RMS over a 5 kHz bandwidth using a verified electrical model for the biological nanopore system. In our biological nanopore experiments studying protein-DNA interactions, we encounter capacitive transients with a nominal settling time of 5 ms. Our amplifier design reduces the settling time to 0.2 ms, without requiring any compensation circuitry.

Keywords

CMOS integrated circuits; DNA; bioelectric phenomena; biological techniques; biomembrane transport; cellular biophysics; differentiating circuits; integrating circuits; molecular biophysics; operational amplifiers; proteins; CMOS process; amplifier input referred noise; biological nanopore applications; biological nanopore system; capacitive transients; current 0.49 pA; integrated patch clamp amplifier; integrator-differentiator architecture; low noise patch clamp amplifier; opamp design; post layout full chip simulation; protein-DNA interactions; time 0.2 ms; Bandwidth; DNA; Nanobioscience; Noise; Resistors; Transient analysis; Algorithms; Amplifiers, Electronic; Biology; Biomedical Engineering; Computer Simulation; DNA; DNA, Single-Stranded; Electrophysiology; Equipment Design; Escherichia coli Proteins; Hemolysin Proteins; Kinetics; Nanopores; Nanotechnology; Patch-Clamp Techniques; Software;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE

Conference_Location

Buenos Aires

ISSN

1557-170X

Print_ISBN

978-1-4244-4123-5

Type

conf

DOI

10.1109/IEMBS.2010.5626570

Filename

5626570