Title :
Absolute Optical Metrology: Nanometers to Kilometers
Author :
Dubovitsky, S. ; Lay, O.P. ; Peters, R.D. ; Liebe, C.C.
Author_Institution :
Jet Propulsion Laboratory, California Institute of Technology, Pasadena CA, USA; serge.dubovitsky@jpl.nasa.gov
Abstract :
We provide an overview of developments in high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.
Keywords :
Extraterrestrial measurements; Frequency; Laser stability; Metrology; Optical interferometry; Optical modulation; Optical sensors; Telescopes; Ultrafast optics; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005. Pacific Rim Conference on
Print_ISBN :
0-7803-9242-6
DOI :
10.1109/CLEOPR.2005.1569822
