DocumentCode
2927654
Title
Absolute Optical Metrology: Nanometers to Kilometers
Author
Dubovitsky, S. ; Lay, O.P. ; Peters, R.D. ; Liebe, C.C.
Author_Institution
Jet Propulsion Laboratory, California Institute of Technology, Pasadena CA, USA; serge.dubovitsky@jpl.nasa.gov
fYear
2005
fDate
30-02 Aug. 2005
Firstpage
1581
Lastpage
1583
Abstract
We provide an overview of developments in high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.
Keywords
Extraterrestrial measurements; Frequency; Laser stability; Metrology; Optical interferometry; Optical modulation; Optical sensors; Telescopes; Ultrafast optics; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005. Pacific Rim Conference on
Print_ISBN
0-7803-9242-6
Type
conf
DOI
10.1109/CLEOPR.2005.1569822
Filename
1569822
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