DocumentCode :
292767
Title :
Bit error probability degradation due to wideband RFI in receiver with 1-bit analog-to-digital converter at front end
Author :
Kwon, Hyuck M.
Author_Institution :
Lockheed Engineering & Sciences Co., Houston, TX, USA
Volume :
2
fYear :
1993
fDate :
11-14 Oct 1993
Firstpage :
629
Abstract :
Many modern receivers employ an intermediate frequency (IF) sampling and a 1-b analog-to-digital (A/D) converter at the receiver front end. After the 1-b A/D converter, synchronizations and bit detection are implemented digitally with the use of an application-specific integrated circuit. The author assumes that perfect PN code, carrier, and bit synchronizations are acquired before an in-band PN spread radio frequency interference (RFI) hits the link. He then considers the RFI effects on the bit error probability of the receiver with the IF sampling and the 1-b A/D converter at the front end
Keywords :
analogue-digital conversion; application specific integrated circuits; error statistics; military communication; pseudonoise codes; radiofrequency interference; signal sampling; spread spectrum communication; superheterodyne receivers; synchronisation; 1-bit analog-to-digital converter; IF sampling; PN code synchronisation; application-specific integrated circuit; bit error probability; bit synchronisation; carrier synchronisation; radio frequency interference; receiver front end; wideband RFI; Analog-digital conversion; Application specific integrated circuits; Degradation; Error probability; Frequency conversion; Frequency synchronization; Radiofrequency interference; Receivers; Sampling methods; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 1993. MILCOM '93. Conference record. Communications on the Move., IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-0953-7
Type :
conf
DOI :
10.1109/MILCOM.1993.408592
Filename :
408592
Link To Document :
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