Three dimensional finite element analysis of N-port waveguide junctions using edge-elements

Author

Wong, M.F. ; Picon, O. ; Fouad Hanna, V.

Author_Institution

CNET, Issy-les-Moulineaux, France

fYear

1992

fDate

1-5 June 1992

Firstpage

417

Abstract

The finite element method is formulated in such a way that the electromagnetic solution of an excited cavity formed from an N-port waveguide junction leads directly and naturally to circuit characteristics of this junction. The use of edge elements eliminates nonphysical solutions. The reliability of the solution is assured compared to a penalty method. Accuracy of the method is demonstrated through the presentation of results for a waveguide T-junction while its efficiency is proven through the presentation of results for a case study of a finline step discontinuity.<>

Keywords

cavity resonators; fin lines; finite element analysis; waveguide couplers; 3D finite element analysis; N-port waveguide junctions; T-junction; circuit characteristics; edge-elements; electromagnetic solution; excited cavity; finline step discontinuity; penalty method; Admittance; Artificial satellites; Electromagnetic waveguides; Finite element methods; Magnetic materials; Maxwell equations; Planar waveguides; Surface waves; Transmission line matrix methods; Waveguide junctions;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1992., IEEE MTT-S International

Conference_Location

Albuquerque, NM, USA

ISSN

0149-645X

Print_ISBN

0-7803-0611-2

Type

conf

DOI

10.1109/MWSYM.1992.188001

Filename

188001