Title :
A super fast and memory efficient diagnostic simulation algorithm for combinational circuits
Author :
Jou, Jer Min ; Chen, Shung-Chih ; Chen, Ren-Der
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
30 May-2 Jun 1994
Abstract :
In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one
Keywords :
automatic testing; circuit analysis computing; combinational circuits; digital simulation; fault diagnosis; logic testing; parallel algorithms; combinational circuits; critical line concept; fault diagnosis; memory efficient diagnostic simulation algorithm; memory usage; parallel simulation concept; primary output responses; stems; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Fault detection; Fault diagnosis; Inspection; Power measurement; Sequential analysis; Size measurement;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.408761
