Title :
Oscillation fault diagnosis for analog circuits based on boundary search with perturbation model
Author :
Kaneko, Mineo ; Sakaguchi, Kazuhiro
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
fDate :
30 May-2 Jun 1994
Abstract :
In this paper, a novel method for oscillation fault diagnosis for analog circuits is presented. Our method is based on the test whether there exist or not a solution of unknown parameters (transconductances of transistors) which makes nodal admittance matrix singular. The boundary search method for testing the existence of such a solution has been modified, and a pre-processing for diagnosis has been developed by which candidates for the cause of oscillation fault can be selected from various element value perturbations and stray elements in the circuit under test
Keywords :
VLSI; analogue integrated circuits; design for testability; fault diagnosis; integrated circuit design; integrated circuit testing; IC design; VLSI; analog circuits; boundary search; circuit under test; element value perturbations; nodal admittance matrix; oscillation fault diagnosis; perturbation model; stray elements; transconductances; unknown parameters; Admittance; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Frequency; Search methods; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.408763
