• DocumentCode
    2928298
  • Title

    Dielectric breakdown of amorphous and semicrystalline polymers

  • Author

    Couderc, H. ; David, E. ; Corlu, Y. ; Fréchette, M. ; Savoie, S.

  • Author_Institution
    Ecole de Technol. Super., Montréal, ON, Canada
  • fYear
    2011
  • fDate
    5-8 June 2011
  • Firstpage
    454
  • Lastpage
    458
  • Abstract
    Dielectric breakdown and endurance of polymers have been of great interest for researchers since years. Procedures for the determination of the dielectric strength at power commercial frequencies of solid insulating material are various and will often give different results. This paper presents short-term dielectric breakdown measurements for two different insulating materials at various thicknesses. The effect of thickness, surrounding medium and crystallinity is discussed.
  • Keywords
    dielectric measurement; electric breakdown; insulating materials; amorphous polymers; semicrystalline polymers; short-term dielectric breakdown measurements; solid insulating material; Crystallization; Dielectric breakdown; Electrodes; Films; Polyethylene; Breakdown procedure; cristallinity; thickness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference (EIC), 2011
  • Conference_Location
    Annapolis, MD
  • ISSN
    pending
  • Print_ISBN
    978-1-4577-0278-5
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/EIC.2011.5996197
  • Filename
    5996197
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2928298