DocumentCode :
2928335
Title :
6.6: Emission imaging of a single crystal LaB6 cathode surface
Author :
Magera, Gerald G. ; Katsap, Victor
Author_Institution :
Appl. Phys. Technol., Inc., McMinnville, OR, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
81
Lastpage :
82
Abstract :
LaB6 cathode is still the emitter of choice in a variable-shape beam (VSB) electron beam lithography tool. In commercial LaB6 cathodes, the (100) crystalline plane is used as the emissive surface. Typical size of emitter is ~70 μm DIA. Though generally stable, this crystalline plane is sensitive to residual atmosphere, and it may have microscopic defects (inclusions, dislocations, etc.) which appear and evolve over the time. Routine initial microscopic inspection of LaB6 cathodes gives us an initial optical/SEM image of surface, which may change during cathode life. With a simple technique, we have obtained LaB6 cathode emission images, which showed features unavailable to optical and electron microscopy. This technique can be used for LaB6 quality evaluation during standard cathode test runs.
Keywords :
cathodes; electrochemical electrodes; electron beam lithography; lanthanum compounds; optical microscopy; scanning electron microscopy; LaB6; electron microscopy; emission imaging; emissive surface; initial optical-SEM image; optical microscopy; residual atmosphere; routine initial microscopic inspection; single crystal cathode surface; variable-shape beam electron beam lithography tool; Cathodes; Crystallization; Electron beams; Electron optics; Lithography; Optical imaging; Optical microscopy; Optical sensors; Scanning electron microscopy; Stimulated emission; LaB6 cathode; e-beam lithography; emission imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503594
Filename :
5503594
Link To Document :
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