DocumentCode :
292837
Title :
A CAD environment for performance and yield driven circuit design employing electromagnetic field simulators
Author :
Bandler, J.W. ; Biernacki, R.M. ; Chen, S.H. ; Grobelny, P.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Volume :
1
fYear :
1994
fDate :
30 May-2 Jun 1994
Firstpage :
145
Abstract :
In this paper we describe a CAD environment for performance and yield driven circuit design with electromagnetic (EM) field simulations employed within the optimization loop. Microstrip structures are accurately simulated and their responses are incorporated into the overall circuit analysis. We unify the component level interpolation technique, devised to handle discretization of geometrical parameters, and the modeling technique used to lighten the computational burden of statistical design centering. We discuss the organization and utilization of the data base system integrated with the modeling technique. We demonstrate the feasibility and benefits of performance and yield optimization with EM simulations
Keywords :
circuit CAD; circuit analysis computing; circuit optimisation; integrated circuit yield; interpolation; microstrip circuits; microwave circuits; CAD environment; component level interpolation technique; discretization; electromagnetic field simulators; geometrical parameters; microstrip structures; modeling technique; optimization loop; overall circuit analysis; performance optimization; statistical design centering; yield driven circuit design; Analytical models; Circuit analysis; Circuit simulation; Circuit synthesis; Computational modeling; Design automation; Design optimization; Electromagnetic fields; Interpolation; Microstrip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
Type :
conf
DOI :
10.1109/ISCAS.1994.408776
Filename :
408776
Link To Document :
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