DocumentCode :
2928750
Title :
Fast multi-reference motion estimation via statistical learning for H.264/AVC
Author :
Chiang, Chen-Kuo ; Lai, Shang-Hong
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2009
fDate :
June 28 2009-July 3 2009
Firstpage :
61
Lastpage :
64
Abstract :
In the H.264/AVC coding standard, motion estimation (ME) is allowed to use multiple reference frames to make full use of reducing temporal redundancy in a video sequence. Although it can further reduce the motion compensation errors, it introduces tremendous computational complexity as well. In this paper, we propose a statistical learning approach to reduce the computation involved in the multireference motion estimation. Some representative features are extracted in advance to build a learning model. Then, an off-line pre-classification approach is used to determine the best reference frame number according to the run-time features. It turns out that motion estimation will be performed only on the necessary reference frames based on the learning model. Experimental results show that the computation complexity is about three times faster than the conventional fast ME algorithm while the video quality degradation is negligible.
Keywords :
code standards; image classification; image sequences; motion compensation; motion estimation; statistical analysis; video coding; H.264/AVC coding standard; computation complexity; fast ME algorithm; fast multireference motion estimation; motion compensation errors; motion estimation; multiple reference frames; off-line preclassification approach; statistical learning approach; video quality degradation; video sequence; Automatic voltage control; Computational complexity; Degradation; Feature extraction; Motion compensation; Motion estimation; Redundancy; Runtime; Statistical learning; Video sequences; H.264; Motion estimation; multiple reference frames; statistical learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location :
New York, NY
ISSN :
1945-7871
Print_ISBN :
978-1-4244-4290-4
Electronic_ISBN :
1945-7871
Type :
conf
DOI :
10.1109/ICME.2009.5202436
Filename :
5202436
Link To Document :
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