• DocumentCode
    2928759
  • Title

    3.5: Sheet beam EIK sensitivity to multimoding and circuit imperfections

  • Author

    Pasour, John ; Nguyen, Khanh ; Wright, Edward ; Levush, Baruch

  • Author_Institution
    Vacuum Electron. Branch, US Naval Res. Lab., Washington, DC, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    45
  • Lastpage
    46
  • Abstract
    A sheet-beam Extended Interaction Klystron (EIK) is an attractive MMW amplifier because of its enhanced power capability, compactness, and relatively high gain per unit length. However, an intrinsic problem with a sheet beam amplifier is its susceptibility to multimoding, which results because the width of the device is typically larger than a wavelength. Even in its ideal configuration, a sheet beam slow wave structure can support a number of closely spaced modes. Furthermore, small imperfections or asymmetries can excite a fundamental TE10 mode in the rectangular beam tunnel, which can cause oscillation or otherwise degrade performance. We have performed 3D PIC simulations (using MAGIC and ICEPIC) to study these effects in several different EIK structures. We will describe methods for minimizing the deleterious effects of multimoding and imperfections, present results of the simulations, and compare the two PIC codes.
  • Keywords
    klystrons; millimetre wave amplifiers; slow wave structures; 3D PIC simulations; MMW amplifier; PIC codes; circuit imperfections; extended interaction klystron; multimoding; sheet beam EIK sensitivity; sheet beam slow wave structure; Circuits; Frequency; High power amplifiers; Klystrons; Laboratories; Low voltage; Millimeter wave technology; Optical coupling; Power generation; Topology; EIK; ICEPIC; MAGIC; Sheet beam; amplifier; millimeter wave; vacuum electronic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503612
  • Filename
    5503612