A full wave simulation of disturbances in picosecond signals by electro-optic probing

Author

Conn, D. ; Xiaohua Wu ; Song, J. ; Nckerson, K.

Author_Institution

Commun. Res. Lab., McMaster Univ., Hamilton, Ont., Canada

fYear

1992

fDate

1-5 June 1992

Firstpage

665

Abstract

Disturbances induced in electric fields near coplanar waveguides by electrooptic dielectric sampling probes were studied by using a three-dimensional finite-difference time-domain technique. Probing effects on the waveguide S-parameters were characterized and the signal field distortion in the optical tip was calculated. It was that probes can have a significant effect on measurement accuracy in the subpicosecond domain. Optical samples taken near the edge of the probe can result in measurements with less distortion than those taken at the center.<>

Keywords

digital simulation; electro-optical devices; measurement errors; probes; waveguides; 3D; CPW electric fields; FD-TD; coplanar waveguides; effect on measurement accuracy; electric field disturbances; electro-optic probing; electrooptic dielectric sampling probes; finite-difference time-domain technique; full wave simulation; optical tip; picosecond signals; signal field distortion; subpicosecond domain; waveguide S-parameters; Coplanar waveguides; Dielectrics; Distortion measurement; Electrooptical waveguides; Finite difference methods; Optical distortion; Optical waveguides; Probes; Sampling methods; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1992., IEEE MTT-S International

Conference_Location

Albuquerque, NM, USA

ISSN

0149-645X

Print_ISBN

0-7803-0611-2

Type

conf

DOI

10.1109/MWSYM.1992.188071

Filename

188071