Title :
Re-decomposition and laser-induced fluorescence imaging: a new imaging technique for nanoparticles distribution in the gas phase
Author :
Muramoto, J. ; Inmaru, T. ; Nakata, Y. ; Okada, T. ; Maeda, M.
Author_Institution :
Graduate Sch. of Electr. Eng., Kyushu Univ., Fukuoka, Japan
Abstract :
Summary form only given. In order to observe the cluster distribution in the gas phase, we proposed a new imaging technique, which is named "Redecomposition laser induced fluorescence (ReD-LIF)" technique. In the ReD-LIF technique, the clusters are decomposed into the atoms by irradiating a laser beam and then the decomposed atoms are visualized by two-dimensional LIF (2D-LIF) technique. When the delay time between the decomposition laser beam and the probe laser beam was short enough, the atom distribution is represented by the cluster distribution. In the report, we demonstrated its usefulness by visualizing the Si cluster distribution in the ablation plume during the condensation process.
Keywords :
Rayleigh scattering; atomic clusters; elemental semiconductors; fluorescence; laser ablation; nanostructured materials; photoluminescence; silicon; Si; Si cluster distribution; ablation plume; atom distribution; atoms; cluster distribution; clusters; condensation process; decomposition laser beam; delay time; gas phase; imaging technique; laser beam; laser-induced fluorescence imaging; nanoparticles distribution; probe laser beam; re-decomposition; redecomposition laser induced fluorescence; two-dimensional laser induced fluorescence technique; Fluorescence; Nanoparticles;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.907323