Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

Summary form only given. We have proposed a very sensitive detection technique of trace element in samples such as polymers, metals and semiconductors. It is called laser ablation atomic fluorescence (LAAF) spectroscopy, which combines laser ablation process to atomize the sample surface and laser-induced fluorescence (LIF) spectroscopy to make a quantitative analysis of the atoms in the ablated plume. LIF provides selective excitation of the trace element to avoid interference due to the resonant excitation with the probe laser. In this study, we demonstrated the availability of LAAF spectroscopy for the nano-meter scale analysis of the sample surface.