Title :
Thermo and Dynamic Mechanical Properties of the High Refractive Index Silicone Resin for Light Emitting Diode Packaging
Author :
Dan Dan Li ; Song Li ; Sheng Zhang ; Xian Wei Liu ; Ching Ping Wong
Author_Institution :
R&D Dept., Niche-Tech Corp., Shantou, China
Abstract :
This paper studies the silicone based materials used for light emitting diode (LED) packaging. A phenyl vinyl silicone resin (PVS) with high refractive index was synthesized in this paper. Four types of packaging materials were prepared by a hydrosilylation reaction between PVS and hydride silicone materials. This study focuses on the thermo and dynamic mechanical properties of the packaging materials. The effect of hardness, coefficient of thermal expansion, moduli, loss factors, and glass transition temperature (Tg) of these materials on their reliability with LED are discussed in this paper. Furthermore, the internal stresses were calculated and the characteristics of the above-mentioned properties were used to explore the reasons of LED failure modes and how to further increase the reliability of LED. In addition, it is helpful for the selection of silicone materials used in LED packaging.
Keywords :
glass transition; hardness; light emitting diodes; refractive index; semiconductor device packaging; semiconductor device reliability; silicones; thermal expansion; thermomechanical treatment; LED packaging; PVS; coefficient of thermal expansion; dynamic mechanical properties; glass transition temperature; hardness; high refractive index; hydride silicone materials; hydrosilylation reaction; light emitting diode packaging; loss factors; moduli; phenyl vinyl silicone resin; reliability; silicone based materials; thermomechanical properties; Heating; Light emitting diodes; Packaging; Resins; Temperature; Temperature measurement; Coefficient of thermal expansion (CTE); dynamic mechanical property; internal stress; light emitting diode (LED) packaging/encapsulation; silicone resin;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2013.2292541