• DocumentCode
    2929091
  • Title

    Empirical mode decomposition descriptor for plane closed curves

  • Author

    Pei, Soo-Chang ; Hsiao, Yu-Zhe ; Lee, Chia-Ying

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    129
  • Lastpage
    132
  • Abstract
    Empirical mode decomposition (EMD) developed by Huang et al. is a nonlinear data analysis method for nonstationary real-valued time series. It has been applied extensively in many research areas. Recently, several generalized EMD methods for complex-valued data analysis was proposed. Since a plane closed curve comprises many two-dimensional (2D) space data points, one can imagine that the boundary points of a plane closed curve as a complex data sequence in the complex plane, and make use of the newly developed complex EMD (CEMD) to do further analysis. We have found that we can use CEMD to achieve boundary points noise-reduction of plane closed curves and perform shift-invariant, scale-invariant and rotation-invariant pattern recognition.
  • Keywords
    computational geometry; data analysis; image denoising; image recognition; image segmentation; image sequences; shape recognition; time series; CEMD method; complex empirical mode decomposition descriptor; complex-valued data sequence analysis; image segmentation; nonlinear data analysis method; nonstationary real-valued time series; plane boundary point noise-reduction; plane closed curve; rotation-invariant pattern recognition; scale-invariant pattern recognition; shape change detection; shift-invariant pattern recognition; two-dimensional space data point; Biomedical signal processing; Data analysis; Image analysis; Image sequence analysis; NASA; Pattern recognition; RF signals; Radio frequency; Shape; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
  • Conference_Location
    New York, NY
  • ISSN
    1945-7871
  • Print_ISBN
    978-1-4244-4290-4
  • Electronic_ISBN
    1945-7871
  • Type

    conf

  • DOI
    10.1109/ICME.2009.5202453
  • Filename
    5202453