• DocumentCode
    292911
  • Title

    A novel consistent MOSFET model for CAD application with reduced calculation time

  • Author

    Miura-Mattausch, M. ; Rahm, A. ; Bollu, M. ; Feldmann, U. ; Savignac, D.

  • Author_Institution
    Corp. Res. & Dev., Siemens AG, Munich, Germany
  • Volume
    1
  • fYear
    1994
  • fDate
    30 May-2 Jun 1994
  • Firstpage
    391
  • Abstract
    The reliability of CAD is dependent on the accuracy of models implemented into circuit simulators. However, precise models such as based on 2D numerical modeling are time consuming. Therefore, simplified analytical models have been developed and widely used. A problem is that such existing models are not valid for advanced MOSFETs with sub-micron channel length due to applied simplifications. By introducing fitting parameters to describe each additional short-channel phenomenon, the consistency of the models is violated. As a result the calculation time for circuit simulation increases considerably. In this paper the authors present a newly developed MOSFET model which describes the transistor characteristics consistently without any nonphysical fitting parameters. Using this model the calculation time is reduced in comparison with the conventional model due to the consistent inclusion of short-channel effects and the diffusion contribution to the carrier transport
  • Keywords
    MOSFET; circuit CAD; circuit analysis computing; semiconductor device models; CAD application; MOSFET model; analytical model; calculation time reduction; carrier transport; circuit simulators; consistent model; diffusion contribution; short-channel effects; submicron channel length; transistor characteristics; Analytical models; Capacitance; Circuit simulation; Intrusion detection; MOSFET circuits; Numerical models; Poisson equations; Research and development; Solid modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-1915-X
  • Type

    conf

  • DOI
    10.1109/ISCAS.1994.408880
  • Filename
    408880