DocumentCode :
2929112
Title :
Comparison of systolic time interval measurement modalities for portable devices
Author :
Carvalho, P. ; Paiva, R.P. ; Couceiro, R. ; Henriques, J. ; Antunes, M. ; Quintal, I. ; Muehlsteff, J. ; Aubert, X.
Author_Institution :
Dept. of Inf. Eng., Sci. & Technol., Univ. of Coimbra, Coimbra, Portugal
fYear :
2010
fDate :
Aug. 31 2010-Sept. 4 2010
Firstpage :
606
Lastpage :
609
Abstract :
Systolic time intervals (STI) have shown significant diagnostic and prognostic value to assess the global cardiac function. Their value has been largely established in hospital settings. Currently, STI are considered a promising tool for long-term patient follow-up with chronic cardiovascular diseases. Several technologies exist that enable beat-by-beat assessment of STI in personal health application scenarios. A comparative study is presented using the echocardiographic gold standard synchronized with impedance cardiography (ICG), phonocardiography (PCG) and photoplethysmography (PPG). The ability of these competing technologies in assessing the pre ejection period (PEP) and the left ventricle ejection time (LVET) is given a general overview with comparative results.
Keywords :
cardiovascular system; diseases; echocardiography; plethysmography; portable instruments; ICG; LVET; PCG; chronic cardiovascular diseases; echocardiography; global cardiac function; impedance cardiography; left ventricle ejection time; phonocardiography; photoplethysmography; portable devices; preejection period; systolic time interval measurement; Biomedical monitoring; Cardiology; Echocardiography; Heart; Impedance; Indexes; Valves; Adult; Cardiography, Impedance; Diagnosis, Computer-Assisted; Female; Humans; Male; Monitoring, Ambulatory; Myocardial Contraction; Phonocardiography; Photoplethysmography; Reproducibility of Results; Sensitivity and Specificity; Systole; Ventricular Function, Left;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4123-5
Type :
conf
DOI :
10.1109/IEMBS.2010.5626642
Filename :
5626642
Link To Document :
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