• DocumentCode
    2929115
  • Title

    Acoustic modeling using an extended phone set considering cross-lingual pronunciation variations

  • Author

    Lyu, Dau-Cheng ; Lyu, Ren-Yuan ; Ming-Tat Ko

  • Author_Institution
    Dept. of Electr. Eng., Chang Gung Univ., Taoyuan, Taiwan
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    133
  • Lastpage
    136
  • Abstract
    To deal with the issue of data unbalanced condition among a task of multilingual speech recognition and a phenomenon of pronunciation variations across languages, we propose an approach to clustering context dependent phones from an extended phone set in an acoustic model trained on a data unbalanced bilingual corpus. First, we generate an extended phone set using pronunciation modeling by a confidence measure between Mandarin and Taiwanese. Second, we use a two-step agglomerative hierarchical clustering with delta Bayesian information criteria to automatically generate a merged extended phone set (MEPS). Third, we choose a parametric modeling technique, model complexity selection, to increase the final number of Gaussian components dependent on the available training data in a data unbalanced condition. The experimental results show that the proposed automatic extending phone clustering approach reduced relative syllable error rate by 8.3% over the best result of the decision tree based phone clustering approach.
  • Keywords
    decision trees; mobile handsets; speech recognition; acoustic modeling; cross-lingual pronunciation variations; data unbalanced condition; decision tree; delta Bayesian information criteria; merged extended phone set; multilingual speech recognition; syllable error rate; two-step agglomerative hierarchical clustering; Acoustic measurements; Acoustical engineering; Automatic speech recognition; Bayesian methods; Computer science; Context modeling; Humans; Natural languages; Speech recognition; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
  • Conference_Location
    New York, NY
  • ISSN
    1945-7871
  • Print_ISBN
    978-1-4244-4290-4
  • Electronic_ISBN
    1945-7871
  • Type

    conf

  • DOI
    10.1109/ICME.2009.5202454
  • Filename
    5202454