• DocumentCode
    2929146
  • Title

    1.1: The truth about terahertz

  • Author

    Armstrong, Carter M.

  • Author_Institution
    Electron Devices, L-3 Commun., San Carlos, CA, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    17
  • Lastpage
    17
  • Abstract
    A few years ago the author had the opportunity to cochair a government review on the state of compact THz source technology. As a point of reference, THz was defined in the study as covering the classical sub-millimeter frequency band (from 300 GHz to 3 THz). Compact coherent radiation devices, with average powers in roughly the 100 μW to 1 W range, in the laser, optoelectronic, solid state, and vacuum electronic technology families were examined at the review, along with a discussion of notional applications, government needs, and foreign THz S&T activity. During the course of completing the final report it became clear to the author that a rudimentary analysis of applications and device power-frequency limits would be beneficial towards putting the THz technological pursuit into proper perspective: to in effect identify the opportunities and challenges of working in the THz regime, or to put it just a bit more bluntly, to help separate the hype from the reality. The main results and conclusions of this analysis will be summarized in this talk.
  • Keywords
    submillimetre wave tubes; terahertz wave devices; vacuum microelectronics; THz source technology; compact coherent radiation device; device power-frequency limits; frequency 300 GHz to 3 THz; laser technology; optoelectronic technology; solid state technology; submillimeter frequency band; terahertz; vacuum electronic technology; Communication industry; Electron devices; Frequency; Government; Power lasers; Solid lasers; Solid state circuits; Submillimeter wave technology; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503626
  • Filename
    5503626