Title :
Integrated Data Processing for PSP/TSP/S3F and model deformation measurements
Author :
Fonov, V. ; Crafton, G. ; Goss, L. ; Fonov, S.
Author_Institution :
McConnell Brain Imaging Center, Montreal Neurological Institute, McGill University, 3801 University Street Montreal, Quebec, Canada H3A 2T5
Abstract :
This paper reviews data processing algorithms used for data registration with Pressure Sensitive Paint (PSP), Shear and Stress Sensitive Film (S3F) and model deformation estimation. Accuracy of the registration algorithm was experimentally estimated in production environment. The paper also includes results of the simultaneous PSP measurement and model deformation estimation of UCAV model and comparison of pressure fields recovered using PSP and S3F technique on the half delta wing model.
Keywords :
Deformation measurements; Pressure-Sensitive Paints; Shear Measurements; Aerodynamics; Brain modeling; Computational fluid dynamics; Data processing; Deformable models; Distortion measurement; Paints; Particle measurements; Pressure measurement; Stress measurement; Deformation measurements; Pressure-Sensitive Paints; Shear Measurements;
Conference_Titel :
Instrumentation in Aerospace Simulation Facilities, 2005. iciasf '05. 21st International Congress on
Print_ISBN :
0-7803-9096-2
DOI :
10.1109/ICIASF.2005.1569914
