Title :
Electrooptic-based two-dimensional THz near-field imaging
Author :
Chen, Q. ; Jiang, Z. ; Zhang, X.-C.
Author_Institution :
Dept. of Phys., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
Summary form only given. Since the first demonstration of THz imaging by Hu and Nuss (1995), many different approaches have been proposed to improve its spatial resolution, the data acquisition time and extend its application, such as T-ray tomography, THz near-field imaging, and real-time two-dimensional (2D) THz electro-optic imaging. Among them, the last one shows a unique advantage on the data acquisition rate, which is only limited by the CCD camera. With our newly developed dynamic subtraction technique with the frame rate as high as 70 frames per second, the signal-to-noise ratio was improved by about two orders. But the system spatial resolution of the usual 2f-2f 2D imaging system is basically limited by aberration and diffraction of the THz beam, because the electro-optic (EO) sensor is positioned at the conjugate plane of the object, which corresponds to the far-field of the THz beam. THz near-field measurement is an effective way to improve the spatial resolution of an imaging system. It is obviously not possible to realize near-field imaging in the conventional transmission EO sampling geometry because the object put right in front of the sensor will block the probe beam. Therefore we change the reflection geometry.
Keywords :
CCD image sensors; aberrations; cameras; electro-optical devices; electro-optical effects; image resolution; infrared imaging; optical images; real-time systems; 2f-2f 2D imaging system; CCD camera; T-ray tomography; THz beam; THz electro-optic imaging; THz imaging; THz near-field imaging; THz near-field measurement; aberration; conjugate plane; data acquisition rate; data acquisition time; diffraction; dynamic subtraction technique; electro-optic imaging; electro-optic sensor; electro-optic-based two-dimensional THz near-field imaging; far-field; frame rate; imaging system; near-field imaging; probe beam; real-time two-dimensional THz electro-optic imaging; reflection geometry; signal-to-noise ratio; spatial resolution; system spatial resolution; Charge coupled devices; Charge-coupled image sensors; Data acquisition; Geometry; High-resolution imaging; Image sensors; Signal to noise ratio; Spatial resolution; Subtraction techniques; Tomography;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.907345