Title :
Electrochemical and thermochemical memories
Author_Institution :
Julich-Aachen Res. Alliance, Sect. Fundamentals of Future Inf. Technol. (JARA-FIT), Forschungszentrum Julich, Julich
Abstract :
The review provides a survey of non-volatile, highly scalable memory devices which are based on electrochemical and thermochemical phenomena controlling the resistance of nanoscale memory cells. The classification of the memory effects, the understanding of the underlying mechanisms, and a sketch of the integration efforts will be presented.
Keywords :
random-access storage; electrochemical memories; nanoscale memory cells; thermochemical memories; Bridge circuits; Conductors; Electric resistance; Electrodes; Insulation; Metal-insulator structures; Morphology; Nonvolatile memory; Thermal resistance; Voltage;
Conference_Titel :
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2377-4
Electronic_ISBN :
8164-2284
DOI :
10.1109/IEDM.2008.4796675
