Title :
A low-power self-biased neural amplifier for implantable EEG recording system ICs
Author :
Kim, Jungsuk ; Pedrotti, Kenneth
Author_Institution :
Dept. of Electr. Eng., Univ. of California at Santa Cruz, Santa Cruz, CA, USA
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
This paper presents a low-power and self-biased neural amplifier for implantable EEG recording system ICs with a high-density interface. To achieve low-power consumption, small die-area, high gain, and high CMRR, a fully differential Chappell OTA is employed along with a capacitive feedback loop. The amplifier operating at ±1.2V has a gain of 65.6dB and consumes a power of 1.7μW. The bandwidth extends from a low-frequency cutoff of below 1 Hz to a high-frequency cutoff of 300Hz which is suitable for EEG signals. This proposed amplifier has an input-referred noise of 9.76μVRMS and THD of 1.86% with respect to 1mVPP input at 100Hz. This low-power self-biased neural amplifier occupies an active die-area of 0.244mm2 and is under fabrication in 0.35μm CMOS 4M2P Process.
Keywords :
CMOS analogue integrated circuits; biomedical electronics; differential amplifiers; electroencephalography; low-power electronics; neural chips; operational amplifiers; prosthetics; CMOS 4M2P process; CMRR; capacitive feedback loop; frequency 100 Hz; frequency 300 Hz; fully differential Chappell OTA; gain 65.6 dB; implantable EEG recording system ICs; input-referred noise; low-power consumption; low-power neural amplifier; power 1.7 muW; self-biased neural amplifier; size 0.35 mum; voltage -1.2 V; voltage 1.2 V; Bandwidth; CMOS integrated circuits; Capacitors; Electrodes; Electroencephalography; Gain; Noise; Amplifiers, Electronic; Electric Power Supplies; Electroencephalography; Equipment Design; Equipment Failure Analysis; Information Storage and Retrieval; Prostheses and Implants; Signal Processing, Computer-Assisted;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5626686