Title :
Full-wave analysis of cascaded junction discontinuities of shielded coplanar type transmission line considering the finite metallization thickness effect
Author :
Tian-Wei Huang ; Itoh, T.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
A full-wave analysis of cascaded junction discontinuities of coplanar type transmission lines, coplanar waveguides (CPWs), and finlines was implemented by a mode-matching technique. Results of the frequency dependence and the transition-length dependence of the scattering parameters of the CPW-to-finline transition incorporating the finite metallization thickness effect are presented.<>
Keywords :
S-parameters; fin lines; metallisation; waveguide theory; waveguides; 26 to 40 GHz; cascaded junction discontinuities; coplanar waveguides; finite metallization thickness effect; finlines; frequency dependence; full-wave analysis; mode-matching technique; scattering parameters; shielded coplanar type transmission line; transition-length dependence; Circuits; Coplanar transmission lines; Coplanar waveguides; MMICs; Metallization; Power transmission lines; Scattering parameters; Transmission line discontinuities; Waveguide discontinuities; Waveguide junctions;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.188158