• DocumentCode
    2930281
  • Title

    Protecting caches against multi-bit errors using embedded erasure coding

  • Author

    BanaiyanMofrad, Abbas ; Ebrahimi, Mojtaba ; Oboril, Fabian ; Tahoori, Mehdi B. ; Dutt, Nikil

  • Author_Institution
    Univ. of California, Irvine, Irvine, CA, USA
  • fYear
    2015
  • fDate
    25-29 May 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Technology scaling advancement coupled with operational and environmental effects make embedded memories more vulnerable to both manufacturing and transient errors including multi-bit upsets. Conventional error correcting codes incur high latency, area, and power overheads to correct multi-bit errors. In this paper, we propose Embedded Erasure Coding (EEC), a low-cost technique that can correct multi-bit errors with low overheads. This technique employs interleaved parity bits to provide a fast and low-cost multi-bit error detection. Using the erasure coding concept, the error correction is done by reconstructing the contents of the erroneous cache blocks within each cache set. Our proposed technique trades the performance for higher reliability by reserving a part of the cache (e.g. one way) to store the erasure codes. Our simulation results show that EEC provides high reliability (100% error detection and correction) with lower area overhead as compared to other state-of-the-art techniques while imposing negligible performance overhead (3%).
  • Keywords
    cache storage; error correction codes; interleaved codes; cache blocks; embedded erasure coding; embedded memories; error correcting codes; interleaved parity bits; multi-bit errors; Complexity theory; Decoding; Encoding; Error correction codes; Program processors; Random access memory; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2015 20th IEEE European
  • Conference_Location
    Cluj-Napoca
  • Type

    conf

  • DOI
    10.1109/ETS.2015.7138735
  • Filename
    7138735