DocumentCode
2930327
Title
Micromachining results using industrial fluorine lasers at 157 nm
Author
Scaggs, M. ; Mayer, Elena ; Fair, J. ; Easting, D.
Author_Institution
Lambda Phys. Inc., FL, USA
fYear
2000
fDate
7-12 May 2000
Firstpage
579
Lastpage
580
Abstract
Summary form only given.Our studies utilized a fluorine laser (Lambda Physik NovaLine F600) with more than 20 mJ/ pulse at 600 Hz. The samples were machined by mask imaging. Since radiation at 157 nm is strongly absorbed by oxygen and water vapor, we evacuated the beam path from the output coupler to the objective lens and purged (N/sub 2/) the path between the objective lens and the sample. As a fluorine laser is electrically and mechanically similar to an excimer, we employed an ArF mix into the fluorine laser in order to keep all aspects of the setup equal. We produced features at a fixed fluence of 6.5 J/cm/sup 2/, examined the smoothness of the ablated area, the edge quality and the surrounding material for damage resulting from thermal loading.
Keywords
excimer lasers; fluorine; laser beam machining; micromachining; 157 nm; F/sub 2/; PTFE; Teflon; ablated area smoothness; edge quality; excimer mix; fixed fluence; fused silica; industrial fluorine lasers; laser micromachining; mask imaging; thermal loading induced damage; Computational fluid dynamics; Laser ablation; Metals industry; Micromachining; Steel;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
1-55752-634-6
Type
conf
DOI
10.1109/CLEO.2000.907416
Filename
907416
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