DocumentCode
2930344
Title
Session 20: Displays, sensors, and MEMS - biosensors and 3D hetero integration
Author
Weber, Werner ; Bock, Karlheinz
Author_Institution
Infineon Technologies, Germany
fYear
2008
fDate
15-17 Dec. 2008
Firstpage
1
Lastpage
1
Abstract
This session is integrating two topics. We start with three papers on biosensors and continue with three papers on 3D integration. The first paper by Shoma Kuga from Waseda University is about a detection method for single mismatched DNA on functionalized diamond. It provides a method to detect biomolecules in contact with electrolytic solutions. The second paper by Anuj Dhawan from a collaboration of Duke University and Appalachian University, is about a field enhancement method to achieve an amplified Raman scattering signal in chemical and biological sensing. The bio-part of the session concludes with a simulation study on screening-induced performance limits of nanowire biosensors by Yang Liu of Stanford University. The 3D integration part of the session starts with an invited presentation by Eric Beyne from IMEC and provides progress in different 3D stacking technologies for heterogeneous integration of different application architectures. Both a face-to-face method with microbumps and a 3D stacking method using through-Silicon-via technology are discussed in detail. The fifth paper by Takafumi Fukushima from Tohoku University reports on a self-assembly method for highly parallel 3D integration in heterogeneous applications. The final paper of this session by Fei Fang from Shangai Institute of Microsystem and Information Technology presents a vertically integrated and highly parallel probe card to solve the important wafer-level test problem important in modern heterogeneous integration technologies.
Keywords
Biological system modeling; Biosensors; Chemicals; Collaboration; DNA; Micromechanical devices; Molecular biophysics; Raman scattering; Stacking; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
8164-2284
Print_ISBN
978-1-4244-2377-4
Electronic_ISBN
8164-2284
Type
conf
DOI
10.1109/IEDM.2008.4796730
Filename
4796730
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