Title :
A bulk built-in sensor for detection of fault attacks
Author :
Possamai Bastos, Rodrigo ; Sill Torres, Frank ; Dutertre, J.-M. ; Flottes, M.-L. ; Di Natale, G. ; Rouzeyre, B.
Author_Institution :
TIMA Lab., Grenoble INP, Grenoble, France
Abstract :
This work presents a novel scheme of built-in current sensor (BICS) for detecting transient fault-based attacks of short and long duration as well as from different simultaneous sources. The new sensor is a single mechanism connected to PMOS and NMOS bulks of the monitored logic. The proposed protection strategy is also useful for improving any state-of-the-art Bulk-BICS from pairs of PMOS and NMOS sensors to single sensors.
Keywords :
MOS integrated circuits; electric sensing devices; fault diagnosis; BICS; NMOS sensor; PMOS sensor; bulk-built-in current sensor; logic monitoring; transient fault-based attack detection; CMOS integrated circuits; Circuit faults; MOS devices; Monitoring; Security; Transient analysis; Transistors; Built-in current sensors; concurrent detection; fault attacks; fault tolerance; security; soft errors; transient faults;
Conference_Titel :
Hardware-Oriented Security and Trust (HOST), 2013 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4799-0559-1
DOI :
10.1109/HST.2013.6581565
