Title :
Frontside laser fault injection on cryptosystems - Application to the AES´ last round -
Author :
Roscian, Cyril ; Dutertre, J.-M. ; Tria, Assia
Author_Institution :
Dept. Syst. et Archit. Securisees (SAS), Ecole Nat. Super. des Mines de St.-Etienne (ENSMSE), Gardanne, France
Abstract :
Laser fault injection through the front side (and consequently the metal-flls) of an IC is often performed with medium or small laser beams for the purpose of injecting bytewise faults. We have investigated in this paper the properties of fault injection with a larger laser beam (in the 100/im range). We have also checked whether the bit-set (or bit-reset) fault type still holds or whether the bit-fip fault type may be encountered. Laser injection experiments were performed during the last round of the Advanced Encryption Standard (AES) algorithm running on an ASIC. The gathered data allowed to investigate the obtained fault models, to conduct two usual Differencial Fault Attack (DFA) schemes and to propose a simple version of a third DFA.
Keywords :
application specific integrated circuits; cryptography; fault diagnosis; laser beams; AES algorithm; ASIC; DFA schemes; IC; advanced encryption standard algorithm; bit-fip fault type; bit-set fault type; cryptosystems; differencial fault attack schemes; frontside laser fault injection; laser beams; Circuit faults; Inverters; Laser applications; Laser beams; Laser transitions; Semiconductor lasers; Transient analysis; AES; DFA; fault model; laser fault injection;
Conference_Titel :
Hardware-Oriented Security and Trust (HOST), 2013 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4799-0559-1
DOI :
10.1109/HST.2013.6581576