DocumentCode
2930645
Title
Web image mining using concept sensitive Markov stationary features
Author
Zhang, Chunjie ; Liu, Jing ; Lu, Hanqing ; Ma, Songde
Author_Institution
Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
fYear
2009
fDate
June 28 2009-July 3 2009
Firstpage
462
Lastpage
465
Abstract
With the explosive growth of Web resources, how to mine semantically relevant images efficiently becomes a challenging and necessary task. In this paper, we propose a concept sensitive Markov stationary feature (C-MSF) to represent images and also present a classifier based scheme for web image mining. First, through analyzing the results of Google Image Searcher, we collect an image set, which are highly relevant to a concept. Then the image set is explored to learn a C-MSF about the concept by the algorithm of random walk with restart (RWR), in which the spatial co-occurrence of the bag-of-words representation and the concept information are integrated. Obtaining the concept sensitive representation, SVM is applied to mine the web images, while the highly relevant set are considered as positive examples and other random images as negative ones. Finally, experiments on a crawled web dataset demonstrate the improved performance of the proposed scheme.
Keywords
Internet; Markov processes; data mining; feature extraction; image classification; image representation; learning (artificial intelligence); random processes; support vector machines; vocabulary; Google image searcher; SVM; Web image mining; Web resource; bag-of-words representation; concept sensitive Markov stationary feature learning; image classifier; image representation; random walk-restart algorithm; Data mining; Histograms; Image classification; Image representation; Laboratories; Pattern recognition; Shape; Support vector machine classification; Support vector machines; Vocabulary; Image classification; Image mining; Markov model; feature extraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location
New York, NY
ISSN
1945-7871
Print_ISBN
978-1-4244-4290-4
Electronic_ISBN
1945-7871
Type
conf
DOI
10.1109/ICME.2009.5202534
Filename
5202534
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