Title :
A novel approach to musical genre classification using probabilistic latent semantic analysis model
Author :
Zeng, Zhi ; Zhang, Shuwu ; Li, Heping ; Liang, Wei ; Zheng, Haibo
Author_Institution :
Inst. of Autom., Chinese Acad. of Sci., Beijing, China
fDate :
June 28 2009-July 3 2009
Abstract :
A novel approach based on the probabilistic latent semantic analysis model (pLSA) for automatic musical genre classification is proposed in this paper. Unlike traditional usage, the pLSA is used to model musical genre instead of single music signal in the proposed approach. First, an unsupervised clustering algorithm is utilized to group temporal segments in music signals into several natural clusters. By this means, each music signal is decomposed into a bag of ldquoaudio wordsrdquo. Subsequently, the pLSA model of each musical genre is trained through a new iterative training procedure and well-known EM algorithm. This training procedure can iteratively update the pLSA model parameters by discriminatively computing weight of each training music signal and evidently improve the model´s discriminative performance. Finally, these models can be used to classify new unseen music signals. Experiments on two commonly utilized databases show that our pLSA based approach can give promising results and the iterative learning procedure is effective.
Keywords :
audio signal processing; expectation-maximisation algorithm; music; pattern clustering; probability; signal classification; unsupervised learning; EM algorithm; audio word; automatic musical genre classification; iterative training procedure; music signal decomposition; probabilistic latent semantic analysis model; unsupervised clustering algorithm; Clustering algorithms; Databases; Feature extraction; Histograms; Humans; Iterative algorithms; Mel frequency cepstral coefficient; Multiple signal classification; Support vector machine classification; Support vector machines; MFCC; Musical genre classification; pLSA;
Conference_Titel :
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-4290-4
Electronic_ISBN :
1945-7871
DOI :
10.1109/ICME.2009.5202540