Title :
Characterization of anisotropic substrate materials for microwave applications
Author :
Fritsch, U. ; Wolff, I.
Author_Institution :
Dept. of Electr. Eng., Duisburg Univ., Germany
Abstract :
The authors deal with the characterization of uniaxially anisotropic substrates. The determination of permittivity tensors of anisotropic substrates for integrated circuits was performed on the basis of the measured phase constant of a single microstrip line at several frequencies by using an optimization routine and spectral-domain analysis. The investigations have shown that the dispersion characteristics of microstrip lines on isotropic and anisotropic substrate materials, respectively, differ in a manner which allows determination of the permittivity tensor of the substrate material.<>
Keywords :
dispersion (wave); microstrip lines; microwave integrated circuits; permittivity; spectral-domain analysis; substrates; 10 to 40 GHz; Al/sub 2/O/sub 3/; alumina; anisotropic substrate materials; dispersion characteristics; integrated circuits; microstrip line; microwave applications; optimization routine; permittivity tensors; phase constant; sapphire; spectral-domain analysis; uniaxially anisotropic substrates; Anisotropic magnetoresistance; Dielectric substrates; Differential equations; Dispersion; Frequency; Green function; Maxwell equations; Microstrip; Permittivity measurement; Tensile stress;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.188193
