Title :
A Bayesian approach integrating regional and global features for image semantic learning
Author :
Nguyen, Luong-Dong ; Yap, Ghim-Eng ; Liu, Ying ; Tan, Ah-Hwee ; Chia, Liang-Tien ; Lim, Joo-Hwee
Author_Institution :
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
fDate :
June 28 2009-July 3 2009
Abstract :
In content-based image retrieval, the ldquosemantic gaprdquo between visual image features and user semantics makes it hard to predict abstract image categories from low-level features. We present a hybrid system that integrates global features (G-features) and region features (R-features) for predicting image semantics. As an intermediary between image features and categories, we introduce the notion of mid-level concepts, which enables us to predict an image´s category in three steps. First, a G-prediction system uses G-features to predict the probability of each category for an image. Simultaneously, a R-prediction system analyzes R-features to identify the probabilities of mid-level concepts in that image. Finally, our hybrid H-prediction system based on a Bayesian network reconciles the predictions from both R-prediction and G-prediction to produce the final classifications. Results of experimental validations show that this hybrid system outperforms both G-prediction and R-prediction significantly.
Keywords :
belief networks; content-based retrieval; feature extraction; image classification; image retrieval; learning (artificial intelligence); probability; Bayesian network; G-prediction system; H-prediction system; R-prediction system; abstract image category; content-based image retrieval; global feature; image classification; image semantic learning; mid-level concept; probability; regional feature; semantic gap; visual image feature; Bayesian methods; Content based retrieval; Histograms; Image analysis; Image retrieval; Image segmentation; Layout; Machine learning algorithms; Ontologies; Uncertainty;
Conference_Titel :
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-4290-4
Electronic_ISBN :
1945-7871
DOI :
10.1109/ICME.2009.5202554