Title :
Sensitive characterization of ultrafast phase and amplitude nonlinearities for broadband semiconductor excitation
Author :
Kunde, J. ; Arlt, S. ; Gallmann, L. ; Morier-Genoud, Francois ; Siegner, Uwe ; Keller, Ulrich
Author_Institution :
Inst. of Quantum Electron., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
Summary form only given. We experimentally demonstrate that spectrally resolved (SR) pump-induced phase changes and amplitude nonlinearities can be simultaneously measured with ultra-high sensitivity and 20-fs time resolution over an arbitrarily wide time window. For this purpose, we have combined spectral interferometry with differential transmission (DT) measurements which take advantage of high-frequency (HF) chopping and lock-in techniques. Normalized transmission changes /spl Delta/T/T of about 10/sup -6//Hz 1/2 can be measured thanks to the HF chopping technique.
Keywords :
excitons; high-speed optical techniques; light interferometry; nonlinear optics; semiconductors; sensitivity; visible spectra; 20 fs; HF chopping technique; amplitude nonlinearities; arbitrarily wide time window; broadband semiconductor excitation; differential transmission measurements; high-frequency chopping; lock-in techniques; normalized transmission changes; spectral interferometry; spectrally resolved pump-induced phase changes; time resolution; ultra-high sensitivity; ultrafast amplitude nonlinearities; ultrafast phase nonlinearities; Delay; Frequency; Interference; Optical pumping; Optical sensors; Optimized production technology; Physics; Spectroscopy; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.907468
