DocumentCode :
2931162
Title :
Femtosecond autocorrelation of CW-modelocked pulses from 416-630 nm using a GaN laser diode
Author :
Loza-Alvarez, P. ; Sibbett, W. ; Reid, D.T.
Author_Institution :
Sch. of Phys. & Astron., St. Andrews Univ., UK
fYear :
2000
fDate :
7-12 May 2000
Firstpage :
618
Lastpage :
619
Abstract :
Summary form only given. Sensitive second-order optical autocorrelation measurements of CW-modelocked ultrashort pulses have been demonstrated at a number of wavelengths in the near- and mid-IR using the two-photon response of semiconductor devices but the spectral region which had until now remained difficult to access using two-photon measurement techniques was the visible, principally because of the lack of suitable detectors in which the two-photon response dominated the residual linear response at wavelengths above the bandgap wavelength. Improvements in the quality of GaN semiconductors have resulted recently in the successful fabrication of laser diodes from this material which are now available on a commercial basis. Using one such laser diode with a nominal emission wavelength of 393 nm (Nichia NLHV500) we have found a strong two-photon response across a range of visible wavelengths which has enabled sensitive measurement of intensity and interferometric second-order autocorrelations.
Keywords :
III-V semiconductors; gallium compounds; laser beams; laser mode locking; laser variables measurement; light interferometry; optical correlation; optical pulse generation; semiconductor lasers; two-photon processes; 393 nm; 415 to 630 nm; 440 nm; 540 nm; 630 nm; CW-modelocked pulses; CW-modelocked ultrashort pulses; GaN; GaN laser diode; GaN semiconductors; Nichia NLHV500; bandgap wavelength; commercial basis; fabrication; femtosecond autocorrelation; intensity; interferometric second-order autocorrelations; laser diode; laser diodes; mid-IR region; near-IR region; nominal emission wavelength; residual linear response; semiconductor devices; sensitive measurement; sensitive second-order optical autocorrelation measurements; spectral region; strong two-photon response; two-photon measurement techniques; two-photon response; visible region; visible wavelengths; Autocorrelation; Diode lasers; Optical devices; Optical interferometry; Optical pulses; Optical sensors; Pulse measurements; Semiconductor device measurement; Ultrafast optics; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
Type :
conf
DOI :
10.1109/CLEO.2000.907469
Filename :
907469
Link To Document :
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