DocumentCode :
2931179
Title :
A Lie group based spatiogram similarity measure
Author :
Gong, Liyu ; Wang, Tianjiang ; Liu, Fang ; Chen, Gang
Author_Institution :
Intell. & Distrib. Comput. Lab., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear :
2009
fDate :
June 28 2009-July 3 2009
Firstpage :
582
Lastpage :
585
Abstract :
Spatiograms were generalization of histograms, which can harvest spatial information of images. The similarity measure is important when applying spatiograms to various computer vision problems such as tracking and image retrieval. The original proposed measures use Mahalanobis distance of coordinate mean to measure spatial information in spatiograms. However, spatial information which is described by spatiograms does not lie on vector space. Measures for vector space such as Mahalanobis distance are not effective measures for them. In this paper, We model spatial information as Gaussian approximation of coordinate distributions. Then we parameterize them as a Lie group. Based on Lie group theory, we analyze function space structure of Gaussian pdfs (probability density function) and propose an effective spatiogram similarity measure. We test our measure in object tracking scenarios. Experiments show better tracking results compared with previously proposed measures.
Keywords :
Gaussian distribution; Lie groups; computer vision; image retrieval; object detection; tracking; Gaussian approximation; Gaussian probability density function; Lie group; Mahalanobis distance; computer vision; coordinate distributions; function space structure; histograms; image retrieval; object tracking; similarity measure; spatial information; spatiograms; tracking; vector space; Coordinate measuring machines; Extraterrestrial measurements; Gaussian approximation; Histograms; Image retrieval; Level measurement; Pixel; Probability density function; Space technology; Testing; Lie group; Spatiogram; distance measure; feature descriptor; similarity measure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location :
New York, NY
ISSN :
1945-7871
Print_ISBN :
978-1-4244-4290-4
Electronic_ISBN :
1945-7871
Type :
conf
DOI :
10.1109/ICME.2009.5202563
Filename :
5202563
Link To Document :
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