DocumentCode :
2931378
Title :
Highly reliable CMOS-integrated 11MPixel SiGe-based micro-mirror arrays for high-end industrial applications
Author :
Haspeslagh, Luc ; De Coster, J. ; Pedreira, Olalla Varela ; De Wolf, Ingrid ; Bois, Bert Du ; Verbist, Agnes ; Van Hoof, R. ; Willegems, Myriam ; Locorotondo, Sabrina ; Bryce, George ; Vaes, Jan ; Van Drieenhuizen, Bert ; Witvrouw, Ann
Author_Institution :
IMEC, Leuven
fYear :
2008
fDate :
15-17 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
In this paper we report for the first time on the fabrication of very reliable CMOS-integrated 10 cm2 11 MPixel SiGe-based micro-mirror arrays on top of 6 level metal CMOS wafers. The array, which is to be used as Spatial Light Modulator (SLM) for optical maskless lithography [1,2,3] consists of 8 mum x 8 mum pixels which can be individually addressed by an analog voltage to enable accurate tilt angle modulation. The pixel density is almost double compared to the state-of-the-art [4]. A stable average cupping below 7 nm, an RMS roughness below 1 nm and long lifetime (>1012 cycles, no creep [5]) are demonstrated.
Keywords :
CMOS integrated circuits; Ge-Si alloys; integrated optics; micromirrors; semiconductor materials; CMOS-integrated micro-mirror arrays; SiGe; metal CMOS wafers; optical maskless lithography; picture size 11 Mpixel; pixel density; spatial light modulator; CMOS logic circuits; CMOS process; CMOS technology; Cost function; Degradation; High K dielectric materials; High-K gate dielectrics; Lithography; Manufacturing processes; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location :
San Francisco, CA
ISSN :
8164-2284
Print_ISBN :
978-1-4244-2377-4
Electronic_ISBN :
8164-2284
Type :
conf
DOI :
10.1109/IEDM.2008.4796779
Filename :
4796779
Link To Document :
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