Title :
A low-cost strategy for testing analog filters
Author :
Vázquez, D. ; Rueda, A. ; Huertas, J.L.
Author_Institution :
Dept. de Diseno de Circuitos Analogicos, Centro Nacional de Microelectron., Seville, Spain
fDate :
30 May-2 Jun 1994
Abstract :
Taking advantage of the structural properties of some universal biquads, a low-cost strategy for off-line testing analog filters has been developed. This new strategy consists in provoking pole-zero cancellation during the test mode operation, without eliminating information about parameters which determine the normal circuit operation. Although area overhead could seem high, it can be very small in many applications
Keywords :
active filters; circuit testing; design for testability; discrete time filters; poles and zeros; switched capacitor filters; DFT technique; SC filters; analog filter testing; biquads; low-cost strategy; offline testing; pole-zero cancellation; test mode operation; Adders; Circuit faults; Circuit testing; Dynamic programming; Electrical fault detection; Fault detection; Filters; Life testing; Signal generators; Transfer functions;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409213