DocumentCode
293142
Title
A low-cost strategy for testing analog filters
Author
Vázquez, D. ; Rueda, A. ; Huertas, J.L.
Author_Institution
Dept. de Diseno de Circuitos Analogicos, Centro Nacional de Microelectron., Seville, Spain
Volume
4
fYear
1994
fDate
30 May-2 Jun 1994
Firstpage
123
Abstract
Taking advantage of the structural properties of some universal biquads, a low-cost strategy for off-line testing analog filters has been developed. This new strategy consists in provoking pole-zero cancellation during the test mode operation, without eliminating information about parameters which determine the normal circuit operation. Although area overhead could seem high, it can be very small in many applications
Keywords
active filters; circuit testing; design for testability; discrete time filters; poles and zeros; switched capacitor filters; DFT technique; SC filters; analog filter testing; biquads; low-cost strategy; offline testing; pole-zero cancellation; test mode operation; Adders; Circuit faults; Circuit testing; Dynamic programming; Electrical fault detection; Fault detection; Filters; Life testing; Signal generators; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location
London
Print_ISBN
0-7803-1915-X
Type
conf
DOI
10.1109/ISCAS.1994.409213
Filename
409213
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