Title :
Simulating nonuniform lossy lines with frequency dependent parameters by the method of characteristics
Author :
El-Zein, Ali ; Haque, M. ; Chowdhury, S.
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
fDate :
30 May-2 Jun 1994
Abstract :
A method of characteristics solution of a nonuniform transmission line having frequency-dependent per-unit-length parameters is formulated. The method, in general, requires the use of FFT to incorporate the frequency-dependent components of the distributed parameters in the time-domain equations. For skin-effect frequency-dependence, an analytical technique to avoid the use of FFT is presented. Also, a formula for estimating the discretization error is given
Keywords :
VLSI; distributed parameter networks; fast Fourier transforms; integrated circuit interconnections; skin effect; time-domain analysis; transmission lines; FFT; IC interconnections; VLSI; discretization error; distributed parameters; frequency-dependent per-unit-length parameters; method of characteristics solution; nonuniform lossy transmission lines; skin-effect frequency-dependence; time-domain equations; Convolution; Distributed parameter circuits; Equations; Frequency dependence; Integrated circuit interconnections; Logic devices; Propagation losses; Time domain analysis; Transmission lines; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409263
