Title :
A new on-wafer large-signal waveform measurement system with 40 GHz harmonic bandwidth
Author :
van Raay, F. ; Kompa, G.
Author_Institution :
Dept. of High Frequency Eng., Kassel Univ., Germany
Abstract :
A novel on-wafer large-signal waveform measurement system with a 40-GHz harmonic frequency range using a microwave transition analyzer is presented. Potential applications are illustrated by the measurement of the harmonic amplitude and phase spectra of the reflection and transmission response of a 0.3- mu m InGaAs pseudomorphic HEMT (high-electron-mobility transistor) under X-band sinusoidal stimulus.<>
Keywords :
III-V semiconductors; gallium arsenide; high electron mobility transistors; indium compounds; microwave measurement; semiconductor device testing; solid-state microwave devices; 0.3 micron; 40 GHz; InGaAs; X-band sinusoidal stimulus; harmonic amplitude; harmonic bandwidth; large-signal waveform measurement system; microwave transition analyzer; phase spectra; pseudomorphic HEMT; reflection response; transmission response; Bandwidth; Coaxial cables; Coaxial components; Frequency measurement; Hardware; Harmonic analysis; Probes; Sampling methods; Testing; Time measurement;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.188279
