DocumentCode
2931938
Title
Arc erosion characteristics of nanocrystalline CuCr contact material
Author
Zhao, Laijun ; Li, Zhenbiao ; Zhou, Youwu
Author_Institution
State Key Lab. of Adv. Electromagn. Eng. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2011
fDate
23-27 Oct. 2011
Firstpage
594
Lastpage
597
Abstract
The objective of this paper is to investigate vacuum arc erosion characteristics of a nanocrystalline CuCr (Cr 50 wt%) contact material. The vacuum contact simulation device was used to conduct contact materials arc erosion tests, and voltage waveforms of make and break arcs between the electrodes were recorded with LabVIEW. Using electricity-ray analytical balance and scanning electron microscopy, the mass loss and the surface structure of CuCr contact materials were obtained. Experiments indicate that the average break arc duration and the cathode contact mass loss of nanocrystalline CuCr50 material were higher than those of two microcrystalline CuCr50 materials. The eroded contact surface structure showed a clear difference: the cathode contact surface of nanocrystalline CuCr50 contact material was uniform, while each cathode contact surface of two microcrystalline CuCr50 materials had an obvious arc erosion pit.
Keywords
cathodes; chromium alloys; copper alloys; nanocontacts; nanostructured materials; scanning electron microscopy; surface structure; vacuum arcs; vacuum circuit breakers; vacuum contactors; CuCr; LabVIEW; arc erosion characteristics; arc erosion pit; cathode contact mass loss; contact material arc erosion test; electricity ray analytical balance; eroded cathode contact surface structure; microcrystalline material; nanocrystalline contact material; scanning electron microscopy; vacuum contact simulation device; voltage waveform; Cathodes; Contacts; Metals; Nanostructured materials; Surface structures; Vacuum arcs; CuCr material; arc erosion characteristics; break arc duration; nanocrystalline;
fLanguage
English
Publisher
ieee
Conference_Titel
Electric Power Equipment - Switching Technology (ICEPE-ST), 2011 1st International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4577-1273-9
Type
conf
DOI
10.1109/ICEPE-ST.2011.6123061
Filename
6123061
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