Thru-match-short calibration for time domain network analysis

A technique for obtaining corrected two-port network parameters from time-domain reflection/transmission (TDR/T) measurements is described. This method is based on the thru-match-short (TMS) calibration procedure and allows for the extension of general vector network analysis (VNA) techniques to the correction of time-domain measurements. The calibration is complete and accounts for both source and load mismatches and pass-thru errors as well as the shape of the excitation waveform. Frequency-domain results from example measurements in both SMA and wafer probe environments using the time domain network analysis technique presented are compared with VNA measurements for validation.<>