Title :
Introducing the through-line deembedding procedure
Author :
Steer, M.B. ; Goldberg, S.B. ; Rinne, G. ; Franzon, P.D. ; Turlik, I. ; Kasten, J.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
The through-line (TL) method is introduced to replace the through-reflect-line (TRL) deembedding procedure. TL utilizes measurements of two lengths of line following approximate open-short-line calibration. TL accounts for the frequency-dependent characteristic impedance of the line and avoids the periodic glitches inherent in the TRL procedure.<>
Keywords :
calibration; microwave measurement; time-domain reflectometry; frequency-dependent characteristic impedance; microwave measurement; open-short-line calibration; through-line deembedding procedure; time domain; Calibration; Capacitance measurement; Digital systems; Fixtures; Frequency; Impedance measurement; Laboratories; Reflection; Testing; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.188284
