Title :
A built-in current sensor for testing analog circuit blocks
Author :
Tabatabaei, Sassan ; Ivanov, André
Author_Institution :
Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC, Canada
Abstract :
A built-in current (BIC) sensor circuit is proposed for supply current (IDD) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the IDD path. The circuit has been implemented using a standard 0.5 μm CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included
Keywords :
CMOS analogue integrated circuits; built-in self test; circuit optimisation; electric current measurement; electric sensing devices; integrated circuit testing; 0.5 micron; BIC sensor; CMOS technology; IDD testing; analog circuit block testing; built-in current sensor; circuit performance tradeoffs; high current measurement sensitivity; optimization guidelines; supply current testing; Analog circuits; CMOS technology; Circuit optimization; Circuit simulation; Circuit testing; Current measurement; Current supplies; Guidelines; Impedance; Performance analysis;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776039
