DocumentCode
2932230
Title
On the issues of oscillation test methodology
Author
Wong, Mike W T
Author_Institution
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, Hong Kong
Volume
3
fYear
1999
fDate
1999
Firstpage
1409
Abstract
In recent years, advances in integration fabrication technologies prompted IC designers to move more analog circuitry onto what had been entirely digital chips, making the verification problem for the full chip more difficult. This paper presents a detailed case study of the testing of an active low pass filter using the oscillation test methodology. We highlight some of the difficulties and shortcomings of this testing approach
Keywords
active filters; integrated circuit testing; low-pass filters; mixed analogue-digital integrated circuits; IC design; active low pass filter; full chip; mixed-signal ICs; oscillation test methodology; verification problem; CMOS process; Circuit faults; Circuit simulation; Circuit testing; Frequency response; Low pass filters; Operational amplifiers; Ring oscillators; SPICE; Virtual colonoscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location
Venice
ISSN
1091-5281
Print_ISBN
0-7803-5276-9
Type
conf
DOI
10.1109/IMTC.1999.776040
Filename
776040
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