DocumentCode :
2932253
Title :
Alternative method of A/D conversion quality verification
Author :
Pokorný, Martin ; Haasz, Vladimir
Author_Institution :
Fac. of Electr. Eng., Czech Tech. Univ., Prague, Czech Republic
Volume :
3
fYear :
1999
fDate :
1999
Firstpage :
1421
Abstract :
Well known methods for testing ADC dynamic quality (FFT Test, best sinusoidal curve fit method, histogram test) require a low-distortion generator and it can be a problem testing high-resolution and middle-resolution high-speed ADCs. The paper describes a new alternative method-spectrum correction test. It is based on the FFT test, but the distortion of a testing signal is corrected. The basic idea is the fact that the Fourier transform is a linear operation. Therefore it is possible to recognise spectral lines, which belong to the generator used and the lines of the ADC. The spectrum measured on the ADC´s output can be corrected for the known spectrum of the generator. A PC simulation was executed to investigate if this method could be used. Then the system for evaluation of the test was designed and realised. The first experience and achieved results are also published in this paper
Keywords :
analogue-digital conversion; electric distortion; high-speed integrated circuits; integrated circuit testing; spectral analysis; A/D conversion; dynamic quality; high-speed ADCs; quality verification; spectral lines; spectrum correction test; testing signal distortion; Frequency; Histograms; Length measurement; Passive filters; Power harmonic filters; Signal generators; Signal resolution; Signal to noise ratio; Testing; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
ISSN :
1091-5281
Print_ISBN :
0-7803-5276-9
Type :
conf
DOI :
10.1109/IMTC.1999.776043
Filename :
776043
Link To Document :
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