DocumentCode
2932680
Title
Low cost flip chip processing and reliability of fast-flow, snap-cure underfills
Author
Houston, Paul N. ; Baldwin, Daniel F. ; Deladisma, Mamico ; Crane, Lawrence N. ; Konarski, Mark
Author_Institution
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
1999
fDate
1999
Firstpage
61
Lastpage
70
Abstract
Flip chip technology is finding increasing applications in the electronics manufacturing and packaging industries and is projected to grow at a 30-40% rate into the next decade. Development of new material systems will enable this growth provided they reduce manufacturing time and enhance reliability. Among these new materials are fast-flow, snap-cure underfills. These underfills can significantly decrease manufacturing costs by eliminating excessive underfill flow times and lengthy dedicated cure cycles. This is especially true in double sided board assembly where snap-cure underfills can be cured during the soak stage of a typical second side reflow cycle while the reflow spike forms the second side interconnects and also provides additional curing. This work presents a study of fast-flow, snap-cure underfill materials and includes data on the reliability in air to air thermal cycling (-55°C to 125°C) and JEDEC Level 3 Moisture Sensitivity Preconditioning prior to thermal cycling of FCOB test vehicles. Samples cured using a second reflow pass are compared to baseline samples snap-cured in a standard batch oven at the underfill manufacturers´ recommended cure schedule. The goal of this work is to determine the performance of fast-flow, snap-cure underfills in the context of low cost flip chip processing using second side reflow for underfill cure. The approach evaluates commercial fast-flow, snap-cure underfills with respect to JEDEC Level 3 Moisture Sensitivity Testing and air to air thermal cycling both with and without the preconditioning
Keywords
chip-on-board packaging; flip-chip devices; integrated circuit packaging; integrated circuit reliability; -55 to 125 C; FCOB; curing process; double sided board assembly; electronic packaging; fast-flow snap-cure underfill; flip-chip processing; moisture sensitivity; reliability; second side reflow cycle; solder interconnect; thermal cycling; Assembly; Costs; Curing; Electronics industry; Electronics packaging; Flip chip; Industrial electronics; Manufacturing industries; Materials reliability; Moisture;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
0-7803-5231-9
Type
conf
DOI
10.1109/ECTC.1999.776065
Filename
776065
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